BYU Home page BRIGHAM YOUNG UNIVERSITY  
Search the Cleanroom:
Home   |   Contact   |   Site Map
Navigation Menu




Ellipsometer
Gaertner Scientific Corporation
Model No. 1169-AK
Manufacture Date: July 1988


Contact Information:
  Faculty Contact:   Aaron Hawkins
  Staff Contact:   Jim Fraser
  Student Contact:   Cameron Hill

Expand All
Compress All
  1. General Information and Usage
  2. Measurement Procedure
  3. Data Conversion
  4. Film Thickness and Index Graphs

Ellipsometry Calculator
This calculator uses the P1, A1, P2, and A2 angles found using an ellipsometer to calculate delta, psi, index and thickness. A "Time and Rate Calculator" is also included; it uses the thickness calculated from the Ellipsometry calculator along with the test wafer growth time and desired thickness to calculate the rate of growth and the time needed to grow the desired thickness at that rate.


Maintained by ECEn IMMERSE Web Team.
Copyright © 1994-Present. Brigham Young University. All Rights Reserved.