3D Profilometer
Measures surface and textural properties by creating a composite 3-D image in true color of whatever is being scanned
Curve Tracer
Measures characteristic curves of semiconductor devices.
Ellipsometer
Highly accurate measuring tool for single or double thickness thin films measurements. Records index of refraction and thickness of various thin films.
Filmetrics F20 Film Measurement System
Measures the thickness and optical constants of any smooth, transparent or thin film with minimal light absorption
Four Point Probe
Measures the resistivity of silicon slices using a collinear four point probe array
HP4145 Parameter Analyzer
Semiconductor parameter analyzer used for curve tracing and wafer testing.
HP4156A Parameter Analyzer
Semiconductor parameter analyzer used for curve tracing and wafer testing.
Leica Microscope
General use microscope equipped with 5x, 10x, 20x, 50x, and 100x objective lenses. Equipped with a digital camera linked to a computer for recording observations.
Metricon Prism Coupler
The Metricon Prism Coupler allows for wafer measurements without an initial knowledge of the thickness. It allows for high accuracy measurements of many materials and substrates.
Nanospec 210
Reflectometry system to measure thickness of silicon dioxide, silicon nitride, photoresist and other films with a small spot size.
NI Parameter Analyzer(PXI-1033)
PCI eXtensions for Instrumentation (PXI) is a PC-based platform that offers a high-performance solution for measurement and automation systems. Currently the primary use for this parameter analyzer is to measure and analyze transistors on wafers.
Probe Station
Probe stations are used to make contact to microscopic features on a device
Profilometer
Surface height profile measurement of microscopic features. Capable of producing measurements up to 10 samples/micrometer.